Nanospec 8000XSE

廠牌 Brand	型號 Model	規格 Configuration	數量 Quantity	圖片 Picture
Nanometrics	Nanospec 8000XSE	100/150/200mm wafer Open cassette DUV-Visible Spectroscopic Reflectometry(SR) from 190 to 780 nm T, n and k measurement on single and multi-layer film stacks OS2 OperationsSystem AFTuser interface	1

　電話直撥　地圖導航

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