Nanospec 9300

廠牌 Brand	型號 Model	規格 Configuration	數量 Quantity	圖片 Picture
Nanometrics	Nanospec 9300	200 or 300mm wafer Open cassette or 300mm FOUP DUV-Visible Spectroscopic Reflectometry(SR) from 190 to 780 nm Spectroscopic Ellipsometry (SE) from 245 to 1000 nm T, n and k measurement on single and multi-layer film stacks Windows NT OS for real-time, multi-tasking operations N2000 user interface compliant to SEMI standard	1

　電話直撥　地圖導航

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